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Figure 1 to enhance OEE by using EES
Figure 1's source is ISMT. It is to show the Advanced Process Control(APC), Advanced Equipment Control(AEC), FDC a Figure is the roadmap proposed by SEMI 1st Symposium on Current SEMI Standards Information & Control Activity-8 Oct.2002.
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Lumax to fulfill SEMI EES roadmap provides the data acquisition platform AutoFABTM:
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Comply with SEMI PR8 proposed standard |
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Combine data from Wafer, Array, Cell and Facility |
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(c) Extensibility, uniform, flexibility and integrated platform
AutoFAB the EES platform can support all quipment engineering applications, for example, APC applications, AEC application, etc.
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AutoFABTM provides a platform toward SEMI e-Diag roadmap |
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